Touchstone analysis
Import, inspect, visualize, and export one-port and two-port measurement data.
Engineering
SakuRF
From RF measurements to useful device insight.
RF engineering software for measurement analysis, de-embedding, and device characterization. The initial release focuses on the SakuRF Characterize workflow.
In developmentTarget release: December 2026
Features and release timing are development targets and may change as testing progresses.
What it is for
For RF engineers and researchers who need a practical desktop workflow for inspecting measured networks, removing fixture effects, and extracting device parameters.
Planned for the initial release
De-embedding
Remove pad and fixture effects using supported calibration structures and methods.
Transmission lines
Extract propagation, attenuation, characteristic impedance, and related transmission-line parameters.
Inductors and capacitors
Evaluate component characteristics such as inductance, capacitance, quality factor, and resonance behavior.